1.0IRDQhttps://irdq.ca/en/racineincdevhttps://irdq.ca/en/author/racineincdev/Atomic Force Microscopy (afm) (Enviroscope) | IRDQrich600338<blockquote class="wp-embedded-content" data-secret="AYUKaecaXi"><a href="https://irdq.ca/en/equipements/atomic-force-microscopy-afm-enviroscope/">Atomic Force Microscopy (afm) (Enviroscope)</a></blockquote><iframe sandbox="allow-scripts" security="restricted" src="https://irdq.ca/en/equipements/atomic-force-microscopy-afm-enviroscope/embed/#?secret=AYUKaecaXi" width="600" height="338" title="“Atomic Force Microscopy (afm) (Enviroscope)” — IRDQ" data-secret="AYUKaecaXi" frameborder="0" marginwidth="0" marginheight="0" scrolling="no" class="wp-embedded-content"></iframe><script type="text/javascript">
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https://irdq.ca/wp-content/uploads/2021/02/icons-irdq-bg-1.jpg600600Additional information MANUFACTURER Veeco MODEL Enviroscope Samples Samples size : 50 mm maximum (measurement area : 6 mm) Thickness: 12 mm maximum Analysis Modes: contact (defection feedback) and tapping modes Specially designed to perform measurements under controlled atmosphere (vacuum or inert gas), it is also equipped with auxiliary modules allowing electrical or electromechanical measurements Applications Routine topographical […]