1.0IRDQhttps://irdq.ca/en/racineincdevhttps://irdq.ca/en/author/racineincdev/rich600338<blockquote class="wp-embedded-content" data-secret="EtCRvHLrEp"><a href="https://irdq.ca/en/equipements/ellipsometer-ir-vase/">Ellipsometer (IR-VASE)</a></blockquote><iframe sandbox="allow-scripts" security="restricted" src="https://irdq.ca/en/equipements/ellipsometer-ir-vase/embed/#?secret=EtCRvHLrEp" width="600" height="338" title="“Ellipsometer (IR-VASE)” — IRDQ" data-secret="EtCRvHLrEp" frameborder="0" marginwidth="0" marginheight="0" scrolling="no" class="wp-embedded-content"></iframe><script type="text/javascript"> /* <![CDATA[ */ /*! This file is auto-generated */ !function(d,l){"use strict";l.querySelector&&d.addEventListener&&"undefined"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!/[^a-zA-Z0-9]/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret="'+t.secret+'"]'),o=l.querySelectorAll('blockquote[data-secret="'+t.secret+'"]'),c=new RegExp("^https?:$","i"),i=0;i<o.length;i++)o[i].style.display="none";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute("style"),"height"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):"link"===t.message&&(r=new URL(s.getAttribute("src")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener("message",d.wp.receiveEmbedMessage,!1),l.addEventListener("DOMContentLoaded",function(){for(var e,t,s=l.querySelectorAll("iframe.wp-embedded-content"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute("data-secret"))||(t=Math.random().toString(36).substring(2,12),e.src+="#?secret="+t,e.setAttribute("data-secret",t)),e.contentWindow.postMessage({message:"ready",secret:t},"*")},!1)))}(window,document); /* ]]> */ </script> https://irdq.ca/wp-content/uploads/2021/02/icons-irdq-bg-1.jpg600600Additional information MANUFACTURER J.A. Woollam MODEL IR-VASE Analysis Reflexion mode optical analysis with polarized infrared light (quantitative) Lateral resolution: 1 cm Mapping not possible Applications Measurements of films thickness Measurement of refractive index Analysis of chemical composition Measurement of absorption, interfaces, doping, anisotropy and porosity Characteritics Highly specialized equipment that allows the precise measurement of […]