1.0IRDQhttps://irdq.ca/en/racineincdevhttps://irdq.ca/en/author/racineincdev/rich600338<blockquote class="wp-embedded-content" data-secret="QYBR1kvwzP"><a href="https://irdq.ca/en/equipements/transmission-electron-microscope-tem/">Transmission Electron Microscope (tem)</a></blockquote><iframe sandbox="allow-scripts" security="restricted" src="https://irdq.ca/en/equipements/transmission-electron-microscope-tem/embed/#?secret=QYBR1kvwzP" width="600" height="338" title="“Transmission Electron Microscope (tem)” — IRDQ" data-secret="QYBR1kvwzP" frameborder="0" marginwidth="0" marginheight="0" scrolling="no" class="wp-embedded-content"></iframe><script type="text/javascript"> /* <![CDATA[ */ /*! This file is auto-generated */ !function(d,l){"use strict";l.querySelector&&d.addEventListener&&"undefined"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!/[^a-zA-Z0-9]/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret="'+t.secret+'"]'),o=l.querySelectorAll('blockquote[data-secret="'+t.secret+'"]'),c=new RegExp("^https?:$","i"),i=0;i<o.length;i++)o[i].style.display="none";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute("style"),"height"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):"link"===t.message&&(r=new URL(s.getAttribute("src")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener("message",d.wp.receiveEmbedMessage,!1),l.addEventListener("DOMContentLoaded",function(){for(var e,t,s=l.querySelectorAll("iframe.wp-embedded-content"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute("data-secret"))||(t=Math.random().toString(36).substring(2,12),e.src+="#?secret="+t,e.setAttribute("data-secret",t)),e.contentWindow.postMessage({message:"ready",secret:t},"*")},!1)))}(window,document); /* ]]> */ </script> https://irdq.ca/wp-content/uploads/2021/02/icons-irdq-bg-1.jpg600600Additional information MANUFACTURER JEOL MODEL JSM 2100-F Samples Samples are prepared with an Focused Ion Beam dedicated to the preparation of thin lamellas Analysis High Resolution Imaging (dark and light background) Equipped with Field Effect Gun working with an acceleration voltage of 200 kV and 100 kV Lateral resolution : 0.19 nm Characteristics Instrument unique […]