Metricon 2010/M Prism Coupler
Metricon 2010/M Prism Coupler
| MANUFACTURER | Metricon Co. |
|---|---|
| MODEL | 2010/M Prism Coupler |
General description:
Thickness and refractive index/birefringence measurement
Characteristics :
- Bulk glasses, polymers, plastics, garnets and other materials (both rigid and flexible) including liquids
- No matching fluids required
- Determination of sample crystallinity and orientation
- Index anisotropy
- Electro-optic/NLO coefficients
- Dispersion (index vs wavelength)
- Non-contact thick film measurement (2µm up to 300µm)
- Up to five configurable lasers
- Measurements on transparent substrates
- Index from 1.0 to 3.35 in x, y, z axis
- Fully automatic measurements
- Up to 0.0003 index resolution and 0.0001 index accuracy
- 0.5% + 5nm thickness accuracy and 0.3% thickness resolution
- Measured area of 1mm diameter
- to 0.0003 index resolution and 0.0001 index accuracy
- 0.5% + 5nm thickness accuracy and 0.3% thickness resolution
- Measured area of 1mm diameter
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about usage conditions and availability, please fill out the form below. After reviewing your request, we will contact you shortly to offer you the best available solution.