Equipment and processes available

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Categories

Characterization 151

Physico-chemical characterization 10Spectrometric and spectroscopic analysis 22Thermal characterization 5Electrical characterization 3Electrochemical characterization 6Microscopy 20Sample preparation for electron microscopy 1Thin film thickness measurements 9

Scale-up 25

Pilot test bench 8Backend/frontend process 3Characterization techniques - high throughput 1

Cleanroom 59

Other lithographic techniques 6Thin film and micro/nanoparticule growth 4Etcher 3Optical and ebeam lithography 7Backend/frontend process 3Thermal process 7

Materials synthesis and surface functionalization 25

Thin film and micro/nanoparticule growth 9Backend/frontend process 1Electrochemical surface structuring 1Organic material synthesis 1

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NoneAtomic force microscopy (AFM) 10Auger spectroscopy 2BET porosity measurement 1Bioreactor 8calorimeter 1Centrifugal deposits 4Charge and diameter measurement (zeta potential) 3Chemical composition 1chromatographie 1Cyclic voltametry 4Differential scanning calorimetry (DSC) 2Dip-pen nanolithography 1Ebeam deposition 1Ebeam lithography 2Ellipsometry 5Focused ion beam (FIB) 1Fourier transform infrared spectroscopy (FT-IR) 6Furnace annealling 3Glove box 1I/V, C/V and four point probe 3Impedance measurement 1Inductively coupled plasma reactive ion etching (ICP-RIE) 3Ion implant 2Joule effect evaporator 2Laser ablation deposition 2Liquid phase chromatography 2Low–pressure chemical vapor deposition - LPCVD 1Mask aligner 5Microfabrication 4Nuclear magnetic resonance (NMR) 2Plasma enhanced chemical vapor deposition - PECVD 1Polishing 2Porosimeter 1Porosimètre 1Potentiostat 1préparation échantillons 1Preparation of thin slices of samples 1Printers - printable electronic 2Profilometry 4Quartz cristal microbalance 1Raman spectroscopy 3Rapid thermal anneal (RTA) 3RBS spectroscopy 1Scanning electron microscopy (SEM) 5Scanning tunneling microscope / atomic force microscopy (STM/AFM) 4spectrométrie de masse 1Spectroscopie Émission Atomique 1Sputtering deposition 1Surface analysis (TOF-SIMS) 1Thermogravimetry (TGA) 2Thermomechanical analysis (TMA) 1Transmission electron microscopy (TEM) 1Wafer saw 1Wire bonding 1X-Ray photoelectron spectroscopy (XPS) 4Xray diffraction (XRD) 3

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Catégories mobile

Characterization 151

Scale-up 25

Pilot test bench 8Backend/frontend process 3Characterization techniques - high throughput 1

Cleanroom 59

Other lithographic techniques 6Thin film and micro/nanoparticule growth 4Etcher 3Optical and ebeam lithography 7Backend/frontend process 3Thermal process 7

Materials synthesis and surface functionalization 25

Thin film and micro/nanoparticule growth 9Backend/frontend process 1Electrochemical surface structuring 1Organic material synthesis 1

Search Products

Tag

NoneAtomic force microscopy (AFM)Auger spectroscopyBET porosity measurementBioreactorcalorimeterCentrifugal depositsCharge and diameter measurement (zeta potential)Chemical compositionchromatographieCyclic voltametryDifferential scanning calorimetry (DSC)Dip-pen nanolithographyEbeam depositionEbeam lithographyEllipsometryFocused ion beam (FIB)Fourier transform infrared spectroscopy (FT-IR)Furnace anneallingGlove boxI/V, C/V and four point probeImpedance measurementInductively coupled plasma reactive ion etching (ICP-RIE)Ion implantJoule effect evaporatorLaser ablation depositionLiquid phase chromatographyLow–pressure chemical vapor deposition - LPCVDMask alignerMicrofabricationNuclear magnetic resonance (NMR)Plasma enhanced chemical vapor deposition - PECVDPolishingPorosimeterPorosimètrePotentiostatpréparation échantillonsPreparation of thin slices of samplesPrinters - printable electronicProfilometryQuartz cristal microbalanceRaman spectroscopyRapid thermal anneal (RTA)RBS spectroscopyScanning electron microscopy (SEM)Scanning tunneling microscope / atomic force microscopy (STM/AFM)spectrométrie de masseSpectroscopie Émission AtomiqueSputtering depositionSurface analysis (TOF-SIMS)Thermogravimetry (TGA)Thermomechanical analysis (TMA)Transmission electron microscopy (TEM)Wafer sawWire bondingX-Ray photoelectron spectroscopy (XPS)Xray diffraction (XRD)

Plasma Enhanced Chemical Vapor Deposition (PECVD)
PlasmaLab System 100 - Modular PH2 $0.00
Particle sizing (Zeta Sizer)
Zetasizer Nano S90 $0.00
Atomic Force Microscope (afm) (CPII)
CPII $0.00
Jaw crusher (Broyeur à machoires)
Inductively coupled plasma reactive ion etcher (icp-drie) Bosch and Cryogenic Processes
PlasmaLab System 100 – Modular ICP180 $0.00
Auger Spectroscopy (NanoSAM)
NanoSAM $0.00
Time of Flight Secondary Ion Mass Spectrometer (tof-sims)
NR-9200HR $0.00
5 Liters Reactor
N/A $0.00
Aligner (MJB3)
MJB3 $0.00
Wafer Saw (ADT 7100 Provectus)
ADT 7100 Provectus $0.00
Rapid Thermal Annealing (rta) (Heatpulse 410)
Heatpulse 410 $0.00
Magnetron Sputtering
N/A $0.00
Spin Coater (SpinBall)
SpinBall $0.00
Sputtering
CMS-18 $0.00
Système d’essais mécaniques universel
Osmose Inverse
Autoclave
Wire Bonding
KS4523 $0.00
Inductively coupled plasma reactive ion etcher (icp-rie) Cryogenic process
PlasmaLab System 100 - Modular ICP380 $0.00
Calorimètre différentiel à balayage (DSC)
Mesure de Charge et de Diamètre (Zeta analyzer) (ZetaPlus 90Plus/BI-MAS)(ZetaPlus 90Plus/BI-MAS)
ZetaPlus 90Plus/BI-MAS $0.00
Cyclic Voltammetry (VMP3)
VMP3 $0.00
Atomic Force Microscopy (afm) (Enviroscope)
Enviroscope $0.00
Ellipsometer (IR-VASE)
IR-VASE $0.00
Scanning electron microscope – focused ion beam (SEM-FIB)
Lyra3 $0.00
Spin Coater (WS-400)
WS-400 $0.00
Bet Porosimetry (Autosorb-1)
Autosorb-1 $0.00
Ion Implantation (N/A)
N/A $0.00
Atomic Force Microscopy (afm) (XE-150)
XE-150 $0.00
Mercury intrusion porosimeter
$0.00
120 liters reactor
N/A $0.00
Transmission Electron Microscope (tem)
JSM 2100-F $0.00
Broyeur à boulets Ball mill
Aligner (EVG 620)
EVG 620 $0.00
X-ray Photoelectron Spectroscopy (xps) (Axis-Ultra)
Axis-Ultra $0.00
Low Pressure Chemical Vapor Deposition (lpcvd)
Tystar $0.00
20 liters reactor
N/A $0.00
Four Point Probe Mesurement
S-302 $0.00
Impedance Analyzer
1255B (2 machines) $0.00
Mesure de taille de particules (Partica LA-950)
Fluorimètre
X-Ray Diffractometer (xrd) (X’Pert)
X’Pert $0.00
X-ray Photoelectron Spectroscopy (xps) (Escalab 220i XL)
Escalab 220i XL $0.00
15 Liters Reactor
N/A $0.00
30 Liters Reactor
N/A $0.00
Ellipsometer (VVASE)
VVASE $0.00
X-Ray Diffractometer (xrd) (D8 Advance)
D8 Advance $0.00
Dip-pen Nanolithography
Nscriptor $0.00
Spin Coater (CEE100)
CEE100 $0.00
Fourier Transform Infrared Spectroscopy (ftir) (FTS6000)
FTS6000 $0.00
Zetasizer (mesure de charge et de diamètre de particules) Nano ZSP
Fourier Transform Infrared Spectroscopy (ftir) (Nicolet 6700 / NXR FT-Raman Module)
Nicolet 6700 / NXR FT-Raman Module $0.00
Microscope optique et platine chauffante/refroidissante
Wafer Saw (DAD3350)
DAD3350 $0.00
Joule Effect Evaporator
Home made $0.00
Elastic Recoil Detection (erd)
Accélérateur Tandem 6 MV $0.00
Cyclic Voltammetry (VMP3)
VMP3 $0.00
Atomic Force Microscopy (afm) (Multimode)
Multimode $0.00
Printed Electronics System
F-Serie $0.00
Ellipsometer (M-2000)
M-2000 $0.00
200 liters reactor
N/A $0.00
Differential Scanning Calorimeter (dsc) (DSC-1)
DSC-1 $0.00
Fourier Transform Infrared Spectroscopy (ftir) (Magna-550, Magna-760, Magna-850)
Magna-550, Magna-760, Magna-850 $0.00
Atomic Force Microscopy (afm) (Dimension TM 3100)
Dimension TM 3100 $0.00
400 liters reactor
N/A $0.00
Parylene Deposition
PDS 2010 LabCoater 2 $0.00
Atomic Force Microscopy (afm) (4500 UHV AFM/STM)
4500 UHV AFM/STM $0.00
Focused Ion Beam (fib)
FB 2000-A $0.00
Ion Implantation (IMC-200)
IMC-200 $0.00
Laser Ablation Deposition
IPEX $0.00
Furnace Annealing (GSL-1300-40X)
GSL-1300-40X $0.00
Scanning Electron Microscope (sem) (JSM 7600 TFE)
JSM 7600 TFE $0.00
Differential Scanning Calorimeter (dsc) (823)
823 $0.00
X-ray Photoelectron Spectroscopy (xps) (Escalab MkII)
Escalab MkII $0.00
Rapid Thermal Annealing (rta) (Heatpulse AG610)
Heatpulse AG610 $0.00
Microcalorimètre différentiel à balayage (VP-DSC)
Aligner (200)
200 $0.00
800 liters reactor
N/A $0.00
Aligner (MA4)
MA4 $0.00
Rutherford Backscattering Spectroscopy (rbs)
Accelerator Tandetron 1.7 MV and Tandem 6 MV $0.00
Quartz Crystal Microbalance
QCA922 $0.00
Inductively coupled plasma reactive ion etcher (icp-rie)
PlasmaLab System 100 - Modular ICP380 $0.00
Printer
Dimatix Materials Printer DMP-2800 $0.00
Fourier Transform Infrared Spectroscopy (ftir) (FTS7000-UMA600)
FTS7000-UMA600 $0.00
Thermogravimetry (tga)
SDTA 851 $0.00
Glove box
N/A $0.00
Mélangeur-Malaxeur (pug mixer)
Microwave Plasma Atomic Emission Spectroscopy
4210 MP-AES $0.00
Rapid Thermal Annealing (AW410)
AW410 $0.00
Profilometer (Dektak D150)
Dektak D150 $0.00
I/V and C/V Measurement (Alessi 4500)
Alessi 4500 $0.00
I/V and C/V Measurement (Summit 12000)
Summit 12000 $0.00
Furnace Annealing (Four 3 zones 5566)
Four 3 zones 5566 $0.00
Réacteur 1m3
Atomic Force Microscopy (afm) (Dimensions 3100)
Dimensions 3100 $0.00
Cyclic Voltammetry (1470)
1470 $0.00
Spectromètre UV-Vis
Cyclic Voltammetry (1470)
1470 $0.00
Liquid Phase Chromatography (LC 1200 Series / 6210 TOF LCMS )
LC 1200 Series / 6210 TOF LCMS $0.00
Atomic Force Microscopy (afm) (VT UHV STM/AFM)
VT UHV STM/AFM $0.00
ebeam Lithography
Vistec VB6 UHR EWF $0.00
Filtre à bande
Ellipsometer (RC2)
RC2 $0.00
Furnace Annealing (Thermo Scientific)
Thermo Scientific $0.00
Atomic Force Microscopy (afm) (Multimode)
Multimode $0.00
Atomic Force Microscopy (afm) (Nscriptor)
Nscriptor $0.00
Calorimètre différentiel à balayage
DSC 6000 $0.00
Traitement des eaux-Réservoir
Gas Chromatography/Mass Spectrometry System (TGA-IR-GC/MS)
TGA 8000– FT-IR spectrophotometer (Spectrum Two) – GC (Clarus 690)/MS (Clarus SQ 8 S) PerkinElmer $0.00
Profilometer (Dektak IIA)
Dektak IIA $0.00
Charge and Diameter Measurement (Zeta Analyzer) (Zetasizer Nano Zs)
Zetasizer Nano Zs $0.00
X-ray Photoelectron Spectroscopy (xps)(PHI 5600-ci spectrometer)
PHI 5600-ci spectrometer $0.00
Profilometer (NR-9200HR)
NR-9200HR $0.00
Ebeam evaporator
Home made $0.00
Analyseur thermogravimétrique et de calorimétrie différentielle à balayage simultané (TGA/DSC)
Scanning Electron Microscope (sem) (Quanta 3D FEG)
Quanta 3D FEG $0.00
Ellipsometer (UVISEL-NIR)
UVISEL-NIR $0.00
Auger Spectroscopy (JAMP-30 Auger Microprobe)
JAMP-30 Auger Microprobe $0.00
Four rotatif
Profilometry (XP-2)
XP-2 $0.00
Potentiostat for Electrochemical Nanostructuring
N/A $0.00
Nuclear Magnetic Resonance Spectrometer (nmr) (Inova 600)
Inova 600 $0.00
Atomic Force Microscopy (afm) (AFM/STM Multimode)
AFM/STM Multimode $0.00
Laser Photolithography
DWL-66FS $0.00
Fourier Transform Infrared Spectroscopy (ftir) (MB-Series A and MB-Series F)
MB-Series A and MB-Series F $0.00
Liquid Phase Chromatography (LC 1200 Series / 6410 Triple Quadrupole LCMS)
LC 1200 Series / 6410 Triple Quadrupole LCMS $0.00
Joule Effect Evaporator
Home made $0.00
Polishing (1PM52-1)
1PM52-1 $0.00
Laser Ablation Deposition
3000 $0.00
Polissage (CP3000)
CP3000 $0.00
Atomic Force Microscopy (AFM) (Multimode 8)
Multimode 8 $0.00
Scanning Electron Microscope (sem) (JSM 6300F)
JSM 6300F $0.00
Scanning Electron Microscope (sem) (JSM 7401F)
JSM 7401F $0.00
Electron Beam Deposition
AXXIS $0.00
Atomic Force Microscopy (afm) (Nanoscope IIIa)
Nanoscope IIIa $0.00
Aligner (200)
200 $0.00
Bonder
SB6E $0.00
Nuclear Magnetic Resonance Spectrometer (nmr) (Inova 400)
Inova 400 $0.00
Raman Spectroscopy (RM)
RM $0.00
Raman Spectroscopy (Invia)
Invia $0.00
Raman Spectroscopy (LabRAM 800)
LabRAM 800 $0.00
X-Ray Diffractometer (xrd) (X-Pert PRO MRD)
X-Pert PRO MRD $0.00
Séparateur magnétique
Thermogravimetric Analyzer
TGA 8000 $0.00
Ultramicrotome
MT-7 $0.00
Atomic Force Microscopy (afm) (NanoMan VS)
NanoMan VS $0.00

Equipment and processes available

Plasma Enhanced Chemical Vapor Deposition (PECVD)

Particle sizing (Zeta Sizer)

Atomic Force Microscope (afm) (CPII)

Jaw crusher (Broyeur à machoires)

Inductively coupled plasma reactive ion etcher (icp-drie) Bosch and Cryogenic Processes

Auger Spectroscopy (NanoSAM)

Time of Flight Secondary Ion Mass Spectrometer (tof-sims)

5 Liters Reactor

Aligner (MJB3)

Wafer Saw (ADT 7100 Provectus)

Rapid Thermal Annealing (rta) (Heatpulse 410)

Magnetron Sputtering

Spin Coater (SpinBall)

Sputtering

Système d’essais mécaniques universel

Osmose Inverse

Autoclave

Wire Bonding

Inductively coupled plasma reactive ion etcher (icp-rie) Cryogenic process

Calorimètre différentiel à balayage (DSC)

Mesure de Charge et de Diamètre (Zeta analyzer) (ZetaPlus 90Plus/BI-MAS)(ZetaPlus 90Plus/BI-MAS)

Cyclic Voltammetry (VMP3)

Atomic Force Microscopy (afm) (Enviroscope)

Ellipsometer (IR-VASE)

Scanning electron microscope – focused ion beam (SEM-FIB)

Spin Coater (WS-400)

Bet Porosimetry (Autosorb-1)

Ion Implantation (N/A)

Atomic Force Microscopy (afm) (XE-150)

Mercury intrusion porosimeter

120 liters reactor

Transmission Electron Microscope (tem)

Broyeur à boulets Ball mill

Aligner (EVG 620)

X-ray Photoelectron Spectroscopy (xps) (Axis-Ultra)

Low Pressure Chemical Vapor Deposition (lpcvd)

20 liters reactor

Four Point Probe Mesurement

Impedance Analyzer

Mesure de taille de particules (Partica LA-950)

Fluorimètre

X-Ray Diffractometer (xrd) (X’Pert)

X-ray Photoelectron Spectroscopy (xps) (Escalab 220i XL)

15 Liters Reactor

30 Liters Reactor

Ellipsometer (VVASE)

X-Ray Diffractometer (xrd) (D8 Advance)

Dip-pen Nanolithography

Spin Coater (CEE100)

Fourier Transform Infrared Spectroscopy (ftir) (FTS6000)

Zetasizer (mesure de charge et de diamètre de particules) Nano ZSP

Fourier Transform Infrared Spectroscopy (ftir) (Nicolet 6700 / NXR FT-Raman Module)

Microscope optique et platine chauffante/refroidissante

Wafer Saw (DAD3350)

Joule Effect Evaporator

Elastic Recoil Detection (erd)

Cyclic Voltammetry (VMP3)

Atomic Force Microscopy (afm) (Multimode)

Printed Electronics System

Ellipsometer (M-2000)

200 liters reactor

Differential Scanning Calorimeter (dsc) (DSC-1)

Fourier Transform Infrared Spectroscopy (ftir) (Magna-550, Magna-760, Magna-850)

Atomic Force Microscopy (afm) (Dimension TM 3100)

400 liters reactor

Parylene Deposition

Atomic Force Microscopy (afm) (4500 UHV AFM/STM)

Focused Ion Beam (fib)

Ion Implantation (IMC-200)

Laser Ablation Deposition

Furnace Annealing (GSL-1300-40X)

Scanning Electron Microscope (sem) (JSM 7600 TFE)

Differential Scanning Calorimeter (dsc) (823)

X-ray Photoelectron Spectroscopy (xps) (Escalab MkII)

Rapid Thermal Annealing (rta) (Heatpulse AG610)

Microcalorimètre différentiel à balayage (VP-DSC)

Aligner (200)

800 liters reactor

Aligner (MA4)