Description
Additional information
| MANUFACTURER | Philips |
|---|---|
| MODEL | X’Pert |
Samples
- Types: all crystalline materials (metals, ceramics, inorganic materials, composites, etc.) as bulk or powder materials
Analysis
- Identification of phases and components
- Semi-quantitative or quantitative (with standards)
- Applications: measurement of mechanical stress, phase identification, low angle measurement
Applications
- Measurement of mechanical stress
- Phase identification
- Low angle measurement
Characteristics
- Two detectors: powder method (Bragg-Breantano) and low angle method
- Interchangeable X-ray sources (Cu or Co)
