Description
Additional information
| MANUFACTURER | Omicron Nanotechnology |
|---|---|
| MODEL | VT UHV STM/AFM |
Samples
- Samples size : 9×5 mm2 or 7 mm diameter maximum
- Thickness: 2 mm maximum
- Lateral resolution: atomic
Analysis
- Modes :
- STM : current feedback
- AFM: true non-contact mode (frequency feedback, system with quartz resonator and PLL to follow the resonance)
- Designed to work under UHV and produce images with atomic resolution for either operating modes (STM and AFM). The sample surface cleaning in performed in-situ via direct or indirect heating or by ion sputtering. The main advantage of this system is its ability to perform measurements within a wide range of temperatures, between 25 K and 1500 K.
Applications
- Surface-induced polymerization reactions
- Studies of surface processes
- Analysis of metals, semi-conductors and superconductors with atomic resolution
- Studies of surface phase change transitions
- Studies of inter-molecular interactions; self-assembly, self-organizing
Characteristics
- Measurement pressure: less than 3×10-11
- Measurement temperature : 25 K to 1500 K
- Maximum X and Y scanning dimensions: 12 µm, Z: 1.5 µm
- LEED – Auger Electronic Spectroscopy
- VACSCAN MKS Mass Spectrometer
- ISE 10 ion source (Argon, Hydrogen, Oxygen)
- System of gas injection for experiments regarding deposition and molecular growth on any substrate
