Contact us
Français
0 Items
About us
About IRDQ
Launching a project
Support program
Open orders
Equipment
Equipment and processes available
Use an equipment
Have your equipment listed
Expertises
Solving your problems
Example of expertise
Success stories – some examples
REPERE
Partners
Select Page
Home
/
Equipment and processes available
/
Characterization
/
Thin film thickness measurements
/ Profilometer (Dektak IIA)
Profilometer (Dektak IIA)
$
0.00
Profilometer (Dektak IIA) quantity
Add to cart
Categories:
Characterization
,
Thin film thickness measurements
Tag:
Profilometry
Description
Additional information
Description
Additional information
MANUFACTURER
Sloan
MODEL
Dektak IIA
Analysis
Vertical resolution: 0.6 nm
Scan length: 30 mm
Horizontal resolution: 50 nm
Additional information
MANUFACTURER
Sloan
MODEL
Dektak IIA
Related products
Scanning electron microscope – focused ion beam (SEM-FIB)
Lyra3
$
0.00
Atomic Force Microscopy (afm) (VT UHV STM/AFM)
VT UHV STM/AFM
$
0.00
Atomic Force Microscopy (afm) (Nscriptor)
Nscriptor
$
0.00