Ellipsometer (VVASE)

$0.00

Description

Additional information

MANUFACTURER J.A. Woollam
MODEL VVASE

Samples

  • Sample sizes: maximum 150 mm x 150 mm (6ˮ x 6ˮ)
  • Thickness : maximum 1 cm

Analysis

  • Measurement of thin films optical constants and thickness (quantitative)
  • Mapping possible
  • Spectral resolution: 0.05 nm
  • Measurements via transmission or reflexion mode

Applications

  • Thickness measurement of anisotropic films
  • Measurement of dielectric lens transmission

Characteristics

  • Wavelengths: from 240 to 2500 nm
  • Micrometric sample holder scanning a 45 x 45 mm area on a sample size up to 150 mm
  • Ellipsometric analysis across a 20 ºC to 300 ºC temperature range
  • Self-retarding plate for depolarization measurement
  • Micro-spot objective for a 100 µm beam

Additional information

MANUFACTURER

J.A. Woollam

MODEL

VVASE