Atomic Force Microscopy (afm) (NanoMan VS)

$0.00

Description

Additional information

MANUFACTURER Veeco
MODEL NanoMan VS

Samples

  • Samples size : 150 mm maximum

Analysis

  • Modes: contact, non-contact, lateral force, phase image, magnetic force, electronic force, surface potential and torsion resonance
  • Scanning range: 90 µm (X-Y), 9 µm (Z)
  • Number of measurement points per image: 5120 x 5120
  • Resolution : 16 bits
  • Motorized stage: operating range 120 x 100 mm

Applications

  • Analysis of small surface phases
  • Nanometric scale validation of photoresist final surfaces
  • Surface analysis of hard materials

Characteristics

  • Unidirectional resolution: 2 µm
  • Scanning speed and range adjustable
  • Thickness: 12 mm maximum
  • Z noise: less than 0.1 nm RMS
  • Limitations: some semi-crystalline materials may be analyzed
  • Incompatibility: all soft materials

Additional information

MANUFACTURER

Veeco

MODEL

NanoMan VS