Atomic Force Microscopy (afm) (Multimode)

$0.00

Description

Additional information

MANUFACTURER Digital Instruments
MODEL Multimode

Analyses

  • Modes : contact, tapping, lateral force (LFM), magnetic force (MFM), tunneling (STM), atomic force (AFM), electrochemistry
  • Quantitative topographical measurements
  • Qualitative viscoelastic measurements
  • Mapping possible
  • Lateral resolution: ≤ 1.5 nm
  • Liquid cell
  • Electrochemical cell
  • High resolution scanner

Applications

  • Topographical measurements in air or liquid milieu, measurement of mechanical properties, friction properties, magnetic gradients, electrical gradients, tip/surface interaction forces, electrochemistry

Additional information

MANUFACTURER

Digital Instruments

MODEL

Multimode