Description
Additional information
| MANUFACTURER | Veeco |
|---|---|
| MODEL | AFM/STM Multimode |
Samples
- Samples size: 15 mm maximum
- Thickness: 5 mm maximum
- Lateral resolution : atomic
Analysis
- Modes :
- STM : current feedback
- AFM: contact (deflection feedback) and tapping mode (amplitude feedback)
- Very versatile apparatus, may be configured as Scanning Tunneling Microscope (STM) or as an Atomic Force Microscope (AFM); measurements are performed at ambient atmosphere
Applications
- Routine topographical measurements
- Study of molecules self-organization and their interaction with the substrate
- Material contrast via the detection of friction/adhesion (contact mode) or the cantilever vibration phase (tapping mode)
Characteristics
- Maximum scanning dimensions:
- (STM): X and Y: 500 nm, Z: 200 nm
- (AFM): X and Y: 10 µm, Z: 2.5 µm
- Additional signals available during the scanning: friction (contact mode), phase (tapping mode)
- Cell available for electrochemical measurements in liquid ambient T< 60 °C
ADVANCED TECHNIQUES
- Lateral Magnetic Force Microscopy (MFM)
- Double scan mode with PLL loop to detect and follow the resonance frequency
