X-ray Photoelectron Spectroscopy (xps)(PHI 5600-ci spectrometer)

$0.00

Description

Additional information

MANUFACTURER Physical Electronics
MODEL PHI 5600-ci spectrometer

Analysis

  • Analysis of surface composition
  • Depth sampled: 2 to 10 nm
  • Elements observed : from Lithium

Characteristics

  • Surface descum possible
  • Variable angle analysis
  • Analyzed area: from 300 µm2 to 0.8 mm2

Additional information

MANUFACTURER

Physical Electronics

MODEL

PHI 5600-ci spectrometer