Scanning Electron Microscope (sem) (JSM 7401F)

$0.00

Description

Additional information

MANUFACTURER JEOL
MODEL JSM 7401F

Samples

  • Sample size: 150 mm maximum
  • Thickness: 5 mm maximum

Analysis

  • Acceleration: 0.1 keV to 30 keV
  • Resolution : about 1 nm

Variants

  • Phase analysis by backscattered electron detection
  • Energy Dispersive Spectrometer (EDS) for X-ray elemental analysis                                                                                                                                                                                          

Additional information

MANUFACTURER

JEOL

MODEL

JSM 7401F