Description
Additional information
| MANUFACTURER | JEOL |
|---|---|
| MODEL | JSM 7401F |
Samples
- Sample size: 150 mm maximum
- Thickness: 5 mm maximum
Analysis
- Acceleration: 0.1 keV to 30 keV
- Resolution : about 1 nm
Variants
- Phase analysis by backscattered electron detection
- Energy Dispersive Spectrometer (EDS) for X-ray elemental analysis
