Description
Additional information
| MANUFACTURER | Veeco |
|---|---|
| MODEL | Nanoscope IIIa |
Analyses
- Modes : contact, tapping
- Scan range: 120 µm (X-Y), 5 µm (Z)
- Depth resolution: 0.01 nm
- Lateral resolution: 0.1 nm
Atomic Force Microscopy (afm) (Nanoscope IIIa)
$0.00
Additional information
| MANUFACTURER | Veeco |
|---|---|
| MODEL | Nanoscope IIIa |
