Description
Additional information
| MANUFACTURER | Cascades |
|---|---|
| MODEL | Summit 12000 |
Samples
- Sample sizes : 200 mm maximum
Applications
- I/V and C/V measurements
- Measurement of photodiode response with fiber optics
- Characterization of the Curie point for ferroelectric materials
- Four point probe measurements rve
Characteristics
- DC and RF measurements (Hewlett Packard 4145A Semiconductor Parameter Analyzer, Keithley 2400 Series SourceMeters)
- Temperature: -65 °C to 200 °C
- Available Gas: N2
- CCD camera
- Four point probe measurements of resistivity
