Fisherscope X-RAY XDV-u
Fisherscope X-RAY XDV-u
| MANUFACTURER | Fisher Technology |
|---|---|
| MODEL | Fischerscope X-RAY XDV-µ |
General description:
Material analysis (standard free) or thickness measurement (with calibration standard)
Characteristics :
- Spot size of X-ray beam is 50 microns of diameter
- Adjustable primary energy from 50 keV – 40 keV – 30 keV
- Primary filter choices are: None, Al 1000 microns, Al 500 microns or Ni 10 microns
- Camera system with high magnification for alignment
- Auto-alignment feature
- Maximum sample size of 25 cm x 25 cm x 10 cm
- Thickness measurement uncertainty smaller than 1 nm possible
- Concentration measurement precision of 0.1%
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about usage conditions and availability, please fill out the form below. After reviewing your request, we will contact you shortly to offer you the best available solution.