Atomic Force Microscopy (AFM)
Atomic Force Microscopy (AFM)
| MANUFACTURER | Bruker |
|---|---|
| MODEL | MultiMode 8-HR |
General description:
The MultiMode 8-HR is a high-resolution atomic force microscope (AFM) that delivers nanometer-scale imaging, pico-Newton force measurements, and advanced nanomechanical characterization in air and liquid environments. It is equipped with Bruker’s cutting-edge control electronics and supports a wide range of imaging and measurement modes for materials and surface science research.
Characteristics :
Imaging & Force Modes:
- Contact Mode
- Tapping Mode
- ScanAsyst® automatic imaging optimization
- PeakForce QNM® for quantitative nanomechanical mapping
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about usage conditions and availability, please fill out the form below. After reviewing your request, we will contact you shortly to offer you the best available solution.