Microscopie à force atomique (AFM)
Microscopie à force atomique (AFM)
| FABRICANT | Veeco |
|---|---|
| MODÈLE | Dimension 3000 |
Analyse :
Topographie de surface. Procédés disponibles :
- Contact mode
- Tapping mode
- Image topographique et de phase
Caractéristiques :
- Platine de 6 pouces (150 mm)
- Platine XY avec positionnement manuel
- Contrôleur Nanoscope IIIa
- Logiciel : Nanoscope
Related products
-
Transmission Electron Microscope (tem)
JSM 2100-F $0.00 -
Atomic Force Microscopy (afm) (Enviroscope)
Enviroscope $0.00 -
Atomic Force Microscopy (afm) (4500 UHV AFM/STM)
4500 UHV AFM/STM $0.00 -
Atomic Force Microscopy (afm) (Multimode)
Multimode $0.00 -
Scanning Electron Microscope (sem) (JSM 7401F)
JSM 7401F $0.00
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about usage conditions and availability, please fill out the form below. After reviewing your request, we will contact you shortly to offer you the best available solution.