Contact us
Français

About us
Equipment
Expertises
Partners
News

Select Page

Transmission electron microscopy (TEM)

Filter products No products found!

Categories

Characterization 210

Physico-chemical characterization 15Spectrometric and spectroscopic analysis 26Thermal characterization 8Electrical characterization 10Electrochemical characterization 6Microscopy 25Sample preparation for electron microscopy 2Thin film thickness measurements 9Optical Characterization 1

Scale-up 25

Pilot test bench 8Backend/frontend process 3Characterization techniques - high throughput 1

Cleanroom 59

Other lithographic techniques 6Thin film and micro/nanoparticule growth 4Etcher 3Optical and ebeam lithography 7Backend/frontend process 3Thermal process 7

Materials synthesis and surface functionalization 27

Thin film and micro/nanoparticule growth 10Backend/frontend process 1Electrochemical surface structuring 1Organic material synthesis 1

Caractérisation mécanique 7Fabrication additive 9Mise en forme 20Polymères et composites 9Fabrication additive – Métal 1Usinage 4Post-traitement 3Caractérisation optique 5

Search Products

Tag

NoneAtomic force microscopy (AFM) 10Auger spectroscopy 2BET porosity measurement 1Bioreactor 8calorimeter 1Centrifugal deposits 4Charge and diameter measurement (zeta potential) 3Chemical composition 1chromatographie 1Cyclic voltametry 4Differential scanning calorimetry (DSC) 2Dip-pen nanolithography 1Ebeam deposition 1Ebeam lithography 2Ellipsometry 5Focused ion beam (FIB) 1Fourier transform infrared spectroscopy (FT-IR) 6Furnace annealling 3Glove box 1I/V, C/V and four point probe 3Impedance measurement 1Inductively coupled plasma reactive ion etching (ICP-RIE) 3Ion implant 2Joule effect evaporator 2Laser ablation deposition 2Liquid phase chromatography 2Low–pressure chemical vapor deposition - LPCVD 1Mask aligner 5Microfabrication 4Nuclear magnetic resonance (NMR) 2Plasma enhanced chemical vapor deposition - PECVD 1Polishing 2Porosimeter 1Porosimètre 1Potentiostat 1préparation échantillons 2Preparation of thin slices of samples 1Printers - printable electronic 2Profilometry 4Quartz cristal microbalance 1Raman spectroscopy 3Rapid thermal anneal (RTA) 3RBS spectroscopy 1Scanning electron microscopy (SEM) 5Scanning tunneling microscope / atomic force microscopy (STM/AFM) 4spectrométrie de masse 1Spectroscopie Émission Atomique 1Sputtering deposition 1Surface analysis (TOF-SIMS) 1Thermogravimetry (TGA) 2Thermomechanical analysis (TMA) 1Transmission electron microscopy (TEM) 1Wafer saw 1Wire bonding 1X-Ray photoelectron spectroscopy (XPS) 4Xray diffraction (XRD) 3

Filter products

Catégories mobile

Characterization 210

Physico-chemical characterization 15Spectrometric and spectroscopic analysis 26Thermal characterization 8Electrical characterization 10Electrochemical characterization 6Microscopy 25Sample preparation for electron microscopy 2Thin film thickness measurements 9Optical Characterization 1

Scale-up 25

Pilot test bench 8Backend/frontend process 3Characterization techniques - high throughput 1

Cleanroom 59

Other lithographic techniques 6Thin film and micro/nanoparticule growth 4Etcher 3Optical and ebeam lithography 7Backend/frontend process 3Thermal process 7

Materials synthesis and surface functionalization 27

Thin film and micro/nanoparticule growth 10Backend/frontend process 1Electrochemical surface structuring 1Organic material synthesis 1

Caractérisation mécanique 7Fabrication additive 9Mise en forme 20Polymères et composites 9Fabrication additive – Métal 1Usinage 4Post-traitement 3Caractérisation optique 5

Search Products

Tag

NoneAtomic force microscopy (AFM)Auger spectroscopyBET porosity measurementBioreactorcalorimeterCentrifugal depositsCharge and diameter measurement (zeta potential)Chemical compositionchromatographieCyclic voltametryDifferential scanning calorimetry (DSC)Dip-pen nanolithographyEbeam depositionEbeam lithographyEllipsometryFocused ion beam (FIB)Fourier transform infrared spectroscopy (FT-IR)Furnace anneallingGlove boxI/V, C/V and four point probeImpedance measurementInductively coupled plasma reactive ion etching (ICP-RIE)Ion implantJoule effect evaporatorLaser ablation depositionLiquid phase chromatographyLow–pressure chemical vapor deposition - LPCVDMask alignerMicrofabricationNuclear magnetic resonance (NMR)Plasma enhanced chemical vapor deposition - PECVDPolishingPorosimeterPorosimètrePotentiostatpréparation échantillonsPreparation of thin slices of samplesPrinters - printable electronicProfilometryQuartz cristal microbalanceRaman spectroscopyRapid thermal anneal (RTA)RBS spectroscopyScanning electron microscopy (SEM)Scanning tunneling microscope / atomic force microscopy (STM/AFM)spectrométrie de masseSpectroscopie Émission AtomiqueSputtering depositionSurface analysis (TOF-SIMS)Thermogravimetry (TGA)Thermomechanical analysis (TMA)Transmission electron microscopy (TEM)Wafer sawWire bondingX-Ray photoelectron spectroscopy (XPS)Xray diffraction (XRD)

No products were found matching your selection.

IRDQ is your one-stop-shop to access to Quebec’s R&D infrastructure. Our objective is to facilitate access to over $400 M in equipment and expertise for your company’s R&D activities.

Powered by:

Financial partner:

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Useful links

Launching a project
Open orders
Equipment and processes available
Have your equipment listed
Privacy Policy

Your IRDQ contact:

Mélanie Girard
info@irdq.ca

© 2021 | IRDQ

This website uses cookies

This website uses so-called 'technical' cookies necessary for its proper functioning, audience measurement cookies (generating visitor and site usage statistics to analyze navigation and improve the site), social module cookies (for sharing the URL of a page from the site on social networks), and YouTube cookies (necessary for viewing videos). You can find detailed information in the privacy policy.

Functional Functional Always active

Storage or technical access is strictly necessary for the legitimate purpose of enabling the use of a specific service explicitly requested by the subscriber or Internet user, or for the sole purpose of transmitting a communication over an electronic communications network.

Settings Settings

Storage or technical access is necessary for the legitimate purpose of storing preferences that are not requested by the subscriber or person using the service.

Statistics Statistics

Storage or technical access used exclusively for statistical purposes. Storage or technical access which is used exclusively for anonymous statistical purposes. In the absence of a subpoena, voluntary compliance by your Internet service provider or additional third-party records, information stored or retrieved for this sole purpose generally cannot be used to identify you.

Marketing Marketing

Storage or technical access is necessary to create profiles of Internet users in order to send advertisements, or to track the Internet user on a website or on several websites with similar marketing purposes.

Manage options
Manage services
Manage {vendor_count} vendors
Read more about these purposes

View settings

{title}
{title}
{title}