Profilometry (XP-2)

Profilometry (XP-2)

Additional information MANUFACTURER Ambios MODEL XP-2 Analyses Sampled depth: up to 50 nm Samples thickness: 30 mm max, vertical range: 400 µm max Vertical resolution: 1 Å to 10 µm, 15 Å to 100 µm Lateral resolution: 100 nm Applications Dimensional characterization...
Polishing (1PM52-1)

Polishing (1PM52-1)

Additional information MANUFACTURER Logitech MODEL 1PM52-1 Samples Sample size : up to 75 mm (3 in.) Characteristics Plate rotation speed : 70 rpm maximum Frequency and amplitude controlled eccentric sweep Polishing plate diameter : 30 cm Application: Precision...