Atomic Force Microscopy (afm) (Nscriptor)

$0.00

Description

Additional information

MANUFACTURER NanoINK
MODEL Nscriptor

Samples

  • Samples sizes: Maximum 50 mm
  • Thickness: Maximum 38 mm

Analysis

  • Types : contact mode and AC (tapping) mode
  • Applications: measurements of the size of particle on a surface, film thickness and surface roughness

Characteristics

  • Mapping possible with a precision of 150 nm
  • Lateral resolution: 1 nm
  • XYZ scanner range: 90 x 90 x 8 µm
  • Equipment that allows Dip-Pen Nanolithography

Additional information

MANUFACTURER

NanoINK

MODEL

Nscriptor