Atomic Force Microscopy (afm) (Nscriptor)
Atomic Force Microscopy (afm) (Nscriptor)
Additional information
| MANUFACTURER | NanoINK |
|---|---|
| MODEL | Nscriptor |
Samples
- Samples sizes: Maximum 50 mm
- Thickness: Maximum 38 mm
Analysis
- Types : contact mode and AC (tapping) mode
- Applications: measurements of the size of particle on a surface, film thickness and surface roughness
Characteristics
- Mapping possible with a precision of 150 nm
- Lateral resolution: 1 nm
- XYZ scanner range: 90 x 90 x 8 µm
- Equipment that allows Dip-Pen Nanolithography
Related products
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Atomic Force Microscopy (afm) (Dimension TM 3100)
Dimension TM 3100 $0.00 -
Atomic Force Microscopy (afm) (AFM/STM Multimode)
AFM/STM Multimode $0.00 -
Atomic Force Microscopy (afm) (VT UHV STM/AFM)
VT UHV STM/AFM $0.00
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about usage conditions and availability, please fill out the form below. After reviewing your request, we will contact you shortly to offer you the best available solution.