I/V and C/V Measurement (Summit 12000)
I/V and C/V Measurement (Summit 12000)
Additional information
| MANUFACTURER | Cascades |
|---|---|
| MODEL | Summit 12000 |
Samples
- Sample sizes : 200 mm maximum
Applications
- I/V and C/V measurements
- Measurement of photodiode response with fiber optics
- Characterization of the Curie point for ferroelectric materials
- Four point probe measurements rve
Characteristics
- DC and RF measurements (Hewlett Packard 4145A Semiconductor Parameter Analyzer, Keithley 2400 Series SourceMeters)
- Temperature: -65 °C to 200 °C
- Available Gas: N2
- CCD camera
- Four point probe measurements of resistivity
Related products
To use this equipment
The equipment available is accessible to the academic and industrial research community.
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