Thermal treatment / Anneal

Thermal treatment / Anneal

MANUFACTURER SPT Micro
MODEL AVP-9200

General description:

Vertical furnace for wet/dry silicon oxide thin film growth, and hydrogen anneal

Characteristics :

  • Thermal oxide thickness: 140 ± 6 nm, and 900 ± 20 nm
  • Within wafer thickness non-uniformity: 0.5% (1 sigma)
  • Wafer-to-wafer thickness non-uniformity: 0.4% (1-sigma)
  • Wafer size: 150 mm, 200 mm
  • Production wafers per load: 100
  • Thickness range of wafers: 300 – 1700 µm
  • Temperature range: 950°C – 1150 °C
  • Chamber configuration : Cross-flow
  • Gases used: Oxygen, Hydrogen, Nitrogen, TransLC
  • Mass flow control: ±5 sccm of the target gas flow
  • Annealing environment: Hydrogen/Oxygen
  • Wafer material: Silicon, Silicon-on-Insulator(SOI)

To use this equipment

The equipment available is accessible to the academic and industrial research community.

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