Atomic Force Microscopy (afm) (AFM/STM Multimode)

Description

Additional information

Samples

• Samples size: 15 mm maximum
• Thickness: 5 mm maximum
• Lateral resolution : atomic

Analysis

• Modes :
  • STM : current feedback
  • AFM: contact (deflection feedback) and tapping mode (amplitude feedback)
• Very versatile apparatus, may be configured as Scanning Tunneling Microscope (STM) or as an Atomic Force Microscope (AFM); measurements are performed at ambient atmosphere

Applications

• Routine topographical measurements
• Study of molecules self-organization and their interaction with the substrate
• Material contrast via the detection of friction/adhesion (contact mode) or the cantilever vibration phase (tapping mode)

Characteristics

• Maximum scanning dimensions:
  • (STM): X and Y: 500 nm, Z: 200 nm
  • (AFM): X and Y: 10 µm, Z: 2.5 µm
• Additional signals available during the scanning: friction (contact mode), phase (tapping mode)
• Cell available for electrochemical measurements in liquid ambient T< 60 °C

ADVANCED TECHNIQUES

• Lateral Magnetic Force Microscopy (MFM)
• Double scan mode with PLL loop to detect and follow the resonance frequency