Atomic Force Microscopy (afm) (Multimode)
Atomic Force Microscopy (afm) (Multimode)
Additional information
| MANUFACTURER | Digital Instruments |
|---|---|
| MODEL | Multimode |
Analyses
- Modes : contact, tapping, lateral force (LFM), magnetic force (MFM), tunneling (STM), atomic force (AFM), electrochemistry
- Quantitative topographical measurements
- Qualitative viscoelastic measurements
- Mapping possible
- Lateral resolution: ≤ 1.5 nm
- Liquid cell
- Electrochemical cell
- High resolution scanner
Applications
- Topographical measurements in air or liquid milieu, measurement of mechanical properties, friction properties, magnetic gradients, electrical gradients, tip/surface interaction forces, electrochemistry
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about usage conditions and availability, please fill out the form below. After reviewing your request, we will contact you shortly to offer you the best available solution.