Atomic Force Microscopy (afm) (Nanoscope IIIa)
Atomic Force Microscopy (afm) (Nanoscope IIIa)
Additional information
| MANUFACTURER | Veeco |
|---|---|
| MODEL | Nanoscope IIIa |
Analyses
- Modes : contact, tapping
- Scan range: 120 µm (X-Y), 5 µm (Z)
- Depth resolution: 0.01 nm
- Lateral resolution: 0.1 nm
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about usage conditions and availability, please fill out the form below. After reviewing your request, we will contact you shortly to offer you the best available solution.