Atomic Force Microscopy (afm) (Nanoscope IIIa)

$0.00

Description

Additional information

MANUFACTURER Veeco
MODEL Nanoscope IIIa

Analyses

  • Modes : contact, tapping
  • Scan range: 120 µm (X-Y), 5 µm (Z)
  • Depth resolution: 0.01 nm
  • Lateral resolution: 0.1 nm

Additional information

MANUFACTURER

Veeco

MODEL

Nanoscope IIIa