Focused Ion Beam (fib)

$0.00

Description

Additional information

MANUFACTURER Hitachi
MODEL FB 2000-A

Samples

  • Dimensions of the observed areas: maximum 254 mm x 254 mm (10ˮ x 10ˮ)
  • Dedicated to the preparation of thin lamella samples for subsequent Transmission Electron Microscope (TEM) analysis
  • Types of materials: Metals, Ceramics, Polymers, Composites, etc.

Characteristics

  • Equipped with a Tungsten gun for depositions
  • Equipped with a micro-handler for removing thin lamella samples

Additional information

MANUFACTURER

Hitachi

MODEL

FB 2000-A