I/V and C/V Measurement (Alessi 4500)
I/V and C/V Measurement (Alessi 4500)
Additional information
| MANUFACTURER | Alessi |
|---|---|
| MODEL | Alessi 4500 |
Samples
- Sample sizes : 125 mm maximum
- Allows probes positioning within a few tens of micrometers on various samples allowing electrical measurements of micro-circuits.
Applications
- Diode I/V curve
- Transistors mobility curve
Characteristics
- DC electrical measurements
- Measurements may be performed with 8 micro-probes
- Black box for low current measurements
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about usage conditions and availability, please fill out the form below. After reviewing your request, we will contact you shortly to offer you the best available solution.