Scanning Electron Microscope (sem) (JSM 7600 TFE)
Scanning Electron Microscope (sem) (JSM 7600 TFE)
Additional information
| MANUFACTURER | JEOL |
|---|---|
| MODEL | JSM 7600 TFE |
Samples
- Equipped with a Field Effect Gun (FEG) for the observation of non-conducting samples
Analysis
- High resolution surface imaging
- Lateral resolution : 1.4 nm at 1 kV and 1.0 nm at 15 kV
Characteristics
- Instrument unique in Canada allowing the analysis of non-conducting samples at high resolution
Variants
Detection of back-scatted electrons for phase analysis
- Lateral resolution : 3 nm at 1 kV
- Sample holder for non-conducting samples
Energy Dispersive Spectrometry (EDS) for chemical composition determination
- Semi-quantitative and quantitative (with standards)
- Mapping possible
- Lateral resolution : of the order of one micrometer (depending on the material and the accelerating voltage)
- Applications : Elemental mapping, quantification of the chemical composition of a given phase
- Detection limit: about 0.1% atomic
Wavelength Dispersive Spectrometry (WDS) for chemical composition determination
- Semi-quantitative and quantitative (with standards)
- Mapping possible
- Lateral resolution : of the order of one micrometer (depending on the material and the accelerating voltage)
- Applications : Elemental mapping, quantification of the chemical composition of a given phase
- Detection limit: about 0.1% atomic
Related products
To use this equipment
The equipment available is accessible to the academic and industrial research community.
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