X-ray Diffractometer (XRD)

General description:

The Malvern Panalytical X-ray diffractometer (Empyrean – 3rd Generation) enables a wide variety of measurements to be made on all types of samples (powders, thin films, nanomaterials and solid objects). Non-destructive method allowing the identification and quantification of crystalline phases, short- and long-range atomic order analysis, dimensional and structural characterization of nanomaterials, and determination of layer thickness and surface roughness to name a few.

Applications:

MicroXRF is widely used in a wide range of research fields, including geology, metallurgy, materials science and biotechnology to name a few.

Characteristics :

• Identify and quantify the crystalline phases of various solids by X-ray powder diffraction. Analysis of minerals, metals, ceramics, thin films, fused samples and large samples by reflection. Analysis of light materials, gels and air-sensitive materials by transmission.
• Small or non-homogenous samples with varying composition, lattice strain or preferred orientation of the crystallites by microdiffraction.
• Phase identification and quantification in polycrystalline materials, and residual stress measurement in thin films by Grazing Incidence X-ray Diffraction (GIXRD).
• Study structures, surfaces and interfaces in thin films by X-ray reflectometry (XRR).
• Analyze polymers, glasses, liquids and some pharmaceutical products (interatomic distances and coordination numbers) by Pair Distribution Function (PDF).
• Structural characterization of nanomaterials, providing information such as nanoparticle size distribution, shape and structure by small-angle and wide-angle X-ray scattering (SAXS/WAXS).