X-ray Photoelectron Spectroscopy (xps) (Escalab 220i XL)

$0.00

Description

Additional information

MANUFACTURER VG Scientific
MODEL Escalab 220i XL

Samples

  • Sample size : maximum 25,4 mm x 25,4 mm (1ˮ x 1 ˮ)
  • Thickness : maximum 5 mm

Analysis

  • Chemical analysis of surfaces (qualitative and quantitative)
  • Mapping possible

Characteristics

  • Double polychromatic source: Aluminium Kα1,2 (hν = 1486.6 eV) + Magnesium Kα1,2 (hν = 1253.6 eV)
  • Monochromatic source Aluminium Kα1,2 (hν = 1486.6eV)
  • XL Magnetic Lens
  • Charge compensation for non-conducting samples
  • Main chamber Argon beam scrubbing (0.1 to 10 keV), etch rate of 0.1 to 3 nm/min
  • Vacuum system for analysis chamber: 10 – 10 mbar
  • UV source for Ultraviolet Photoelectron Spectroscopy (UPS)

Additional information

MANUFACTURER

VG Scientific

MODEL

Escalab 220i XL