X-ray Photoelectron Spectroscopy (xps) (Escalab 220i XL)
X-ray Photoelectron Spectroscopy (xps) (Escalab 220i XL)
Additional information
| MANUFACTURER | VG Scientific |
|---|---|
| MODEL | Escalab 220i XL |
Samples
- Sample size : maximum 25,4 mm x 25,4 mm (1ˮ x 1 ˮ)
- Thickness : maximum 5 mm
Analysis
- Chemical analysis of surfaces (qualitative and quantitative)
- Mapping possible
Characteristics
- Double polychromatic source: Aluminium Kα1,2 (hν = 1486.6 eV) + Magnesium Kα1,2 (hν = 1253.6 eV)
- Monochromatic source Aluminium Kα1,2 (hν = 1486.6eV)
- XL Magnetic Lens
- Charge compensation for non-conducting samples
- Main chamber Argon beam scrubbing (0.1 to 10 keV), etch rate of 0.1 to 3 nm/min
- Vacuum system for analysis chamber: 10 – 10 mbar
- UV source for Ultraviolet Photoelectron Spectroscopy (UPS)
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about usage conditions and availability, please fill out the form below. After reviewing your request, we will contact you shortly to offer you the best available solution.