Characterization
Showing 73–81 of 84 results
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Atomic Force Microscopy (afm) (XE-150)
XE-150 $0.00 -
Atomic Force Microscopy (afm) (AFM/STM Multimode)
AFM/STM Multimode $0.00 -
Atomic Force Microscope (afm) (CPII)
CPII $0.00 -
Atomic Force Microscopy (afm) (Enviroscope)
Enviroscope $0.00 -
Atomic Force Microscopy (afm) (NanoMan VS)
NanoMan VS $0.00 -
Atomic Force Microscopy (afm) (Nanoscope IIIa)
Nanoscope IIIa $0.00 -
Scanning electron microscope – focused ion beam (SEM-FIB)
Lyra3 $0.00 -
Scanning Electron Microscope (sem) (Quanta 3D FEG)
Quanta 3D FEG $0.00 -
Scanning Electron Microscope (sem) (JSM 7401F)
JSM 7401F $0.00