Characterization

Showing 73–81 of 84 results

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  Atomic Force Microscopy (afm) (XE-150)

  XE-150 $0.00
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  Atomic Force Microscopy (afm) (AFM/STM Multimode)

  AFM/STM Multimode $0.00
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  Atomic Force Microscope (afm) (CPII)

  CPII $0.00
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  Atomic Force Microscopy (afm) (Enviroscope)

  Enviroscope $0.00
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  Atomic Force Microscopy (afm) (NanoMan VS)

  NanoMan VS $0.00
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  Atomic Force Microscopy (afm) (Nanoscope IIIa)

  Nanoscope IIIa $0.00
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  Scanning electron microscope – focused ion beam (SEM-FIB)

  Lyra3 $0.00
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  Scanning Electron Microscope (sem) (Quanta 3D FEG)

  Quanta 3D FEG $0.00
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  Scanning Electron Microscope (sem) (JSM 7401F)

  JSM 7401F $0.00