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Home / Equipment and processes available / Characterization / Page 9

Characterization

Showing 73–81 of 84 results

  • Atomic Force Microscopy (afm) (XE-150)

    XE-150 $0.00
  • Atomic Force Microscopy (afm) (AFM/STM Multimode)

    AFM/STM Multimode $0.00
  • Atomic Force Microscope (afm) (CPII)

    CPII $0.00
  • Atomic Force Microscopy (afm) (Enviroscope)

    Enviroscope $0.00
  • Atomic Force Microscopy (afm) (NanoMan VS)

    NanoMan VS $0.00
  • Atomic Force Microscopy (afm) (Nanoscope IIIa)

    Nanoscope IIIa $0.00
  • Scanning electron microscope – focused ion beam (SEM-FIB)

    Lyra3 $0.00
  • Scanning Electron Microscope (sem) (Quanta 3D FEG)

    Quanta 3D FEG $0.00
  • Scanning Electron Microscope (sem) (JSM 7401F)

    JSM 7401F $0.00
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IRDQ is your one-stop-shop to access to Quebec’s R&D infrastructure. Our objective is to facilitate access to over $400 M in equipment and expertise for your company’s R&D activities.

 

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  • Launching a project
  • Open orders
  • Equipment and processes available
  • Have your equipment listed

Your IRDQ contact:

SÉBASTIEN GARBARINO
sebastien.garbarino@irdq.ca
(514) 284-0211 ext 226

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