Ellipsometer (IR-VASE)

$0.00

Description

Additional information

MANUFACTURER J.A. Woollam
MODEL IR-VASE

Analysis

  • Reflexion mode optical analysis with polarized infrared light (quantitative)
  • Lateral resolution: 1 cm
  • Mapping not possible

Applications

  • Measurements of films thickness
  • Measurement of refractive index
  • Analysis of chemical composition
  • Measurement of absorption, interfaces, doping, anisotropy and porosity

Characteritics

  • Highly specialized equipment that allows the precise measurement of refractive index in the far infrared region, as well as absorption bands caused by chemical bonds.
  • Allows also the determination of doping in semiconductors
  • Wavelengths: from 2 µm to 30 µm
  • Ellipsometer with variable angle and compensator
  • Available modules: controlled environment chamber with heating and cooling

Additional information

MANUFACTURER

J.A. Woollam

MODEL

IR-VASE