Atomic Force Microscopy (afm) (Multimode)

Description

Additional information

Analyses

• Modes : contact, tapping, lateral force (LFM), magnetic force (MFM), tunneling (STM)
• Quantitative topographical measurements
• Qualitative viscoelastic measurements
• Mapping possible
• Lateral resolution: 2 nm
• Vacuum chamber: 10^-5 Torr
• Temperature control : ≤185 °C (ambient); ≤ 275 °C (vacuum); ≤ 60 °C (liquid)
• Liquid cell

STM Variant

• Quantitative low current tunnel effect microscopy
• Mapping possible
• Lateral resolution: atomic
• Applications: Ambient imaging of conductive and semi-conductive surfaces with atomic resolution

Applications

• Topographical measurements in air or liquid milieu, measurement of mechanical properties, friction properties, roughness, magnetic gradients, electrical gradients, tip/surface interaction forces