Atomic Force Microscope (afm) (CPII)

$0.00

Description

Additional information

MANUFACTURER Veeco
MODEL CPII

Analyses

  • Modes : contact, tapping, non-contact

 

Applications

  • Phase imaging, Lateral Force Microscopy, Magnetic Force Microscopy, Electrical Force Microscopy, Liquid milieu imaging

Additional information

MANUFACTURER

Veeco

MODEL

CPII