Atomic Force Microscope (afm) (CPII)
Atomic Force Microscope (afm) (CPII)
Additional information
| MANUFACTURER | Veeco |
|---|---|
| MODEL | CPII |
Analyses
- Modes : contact, tapping, non-contact
Applications
- Phase imaging, Lateral Force Microscopy, Magnetic Force Microscopy, Electrical Force Microscopy, Liquid milieu imaging
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about usage conditions and availability, please fill out the form below. After reviewing your request, we will contact you shortly to offer you the best available solution.