Atomic Force Microscopy (afm) (Enviroscope)

Description

Additional information

Samples

• Samples size : 50 mm maximum (measurement area : 6 mm)
• Thickness: 12 mm maximum

Analysis

• Modes: contact (defection feedback) and tapping modes
• Specially designed to perform measurements under controlled atmosphere (vacuum or inert gas), it is also equipped with auxiliary modules allowing electrical or electromechanical measurements

Applications

• Routine topographical measurement
• Material contrast via the detection of friction/adhesion or the cantilever vibration phase specific to each material
• Detection of materials piezoelectricity and elasticity
• Detection and control of the polarization of the piezoelectric response
• Mapping of resistance; of electrical and/or magnetic gradients; of surface potential

Characteristics

• Resolution: 1 nm
• Pressure: 10^-5 to 1400 mbar
• Noise: ~0.1 nm RMS (Z direction) with turbo pump
• Maximum scanning dimension: 90 µm (X) and 4 µm (Y)
• Additional signals during scanning: friction (contact mode), phase (tapping mode)
• Current measurement module: Preamplifier Femto (DLPCA 200) and DC current source (Keithley 2400).
• Current noise: < 0.5 pA.
• Electromechanical measurement module: Lock-in amplifier (Signal Recovery 7265) and DC current source (Keithley 2400).
• Noise for the piezoelectric response: < 0.1 pm/V

ADVANCED TECHNIQUES

• Lateral Electrostatic/Magnetic Force Microscopy (EFM / MFM)
• Double scan mode with PLL loop to detect and follow the resonance frequency
• Kelvin probe microscopy (detection of surface potential)