Atomic Force Microscopy (afm) (Multimode)
Atomic Force Microscopy (afm) (Multimode)
Additional information
| MANUFACTURER | Digital Instruments |
|---|---|
| MODEL | Multimode |
Analyses
- Modes : contact, tapping, lateral force (LFM), magnetic force (MFM), tunneling (STM)
- Quantitative topographical measurements
- Qualitative viscoelastic measurements
- Mapping possible
- Lateral resolution: 2 nm
- Vacuum chamber: 10-5 Torr
- Temperature control : ≤185 °C (ambient); ≤ 275 °C (vacuum); ≤ 60 °C (liquid)
- Liquid cell
STM Variant
- Quantitative low current tunnel effect microscopy
- Mapping possible
- Lateral resolution: atomic
- Applications: Ambient imaging of conductive and semi-conductive surfaces with atomic resolution
Applications
- Topographical measurements in air or liquid milieu, measurement of mechanical properties, friction properties, roughness, magnetic gradients, electrical gradients, tip/surface interaction forces
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about usage conditions and availability, please fill out the form below. After reviewing your request, we will contact you shortly to offer you the best available solution.