Ellipsometer (IR-VASE)
Ellipsometer (IR-VASE)
Additional information
| MANUFACTURER | J.A. Woollam |
|---|---|
| MODEL | IR-VASE |
Analysis
- Reflexion mode optical analysis with polarized infrared light (quantitative)
- Lateral resolution: 1 cm
- Mapping not possible
Applications
- Measurements of films thickness
- Measurement of refractive index
- Analysis of chemical composition
- Measurement of absorption, interfaces, doping, anisotropy and porosity
Characteritics
- Highly specialized equipment that allows the precise measurement of refractive index in the far infrared region, as well as absorption bands caused by chemical bonds.
- Allows also the determination of doping in semiconductors
- Wavelengths: from 2 µm to 30 µm
- Ellipsometer with variable angle and compensator
- Available modules: controlled environment chamber with heating and cooling
Related products
-
Scanning Electron Microscope (sem) (JSM 7600 TFE)
JSM 7600 TFE $0.00 -
Scanning electron microscope – focused ion beam (SEM-FIB)
Lyra3 $0.00 -
Scanning Electron Microscope (sem) (Quanta 3D FEG)
Quanta 3D FEG $0.00 -
Atomic Force Microscopy (afm) (4500 UHV AFM/STM)
4500 UHV AFM/STM $0.00 -
Scanning Electron Microscope (sem) (JSM 7401F)
JSM 7401F $0.00
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about usage conditions and availability, please fill out the form below. After reviewing your request, we will contact you shortly to offer you the best available solution.