Four Point Probe Mesurement

Additional information

MANUFACTURER	Lucas Signatone Corp.
MODEL	S-302

Characteristics

Quantitative measurement of thin films resistivity
Measurement of thin films thickness

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Categories: Characterization, Electrical characterization Tag: I/V, C/V and four point probe

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The equipment available is accessible to the academic and industrial research community.

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Four Point Probe Mesurement

Four Point Probe Mesurement

Additional information

Characteristics

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