Magnetron Sputtering

Additional information

MANUFACTURER N/A
MODEL N/A

Samples

  • Sample size : 1 mm to 100 mm (4 in.)
  • Wafer uniformity : 13% on 100 mm (4 in.

Characteristics

  • Pressure  : up to 1×10-6 Torr
  • Pass through for sample transfer
  • Target types : 50 mm (2 in.) diameter, 99.9% purity
  • Substrate types allowed: semiconductors, metal and plastics
  • Gas: Ar, N2, O2
  • Deposition rate: 1 to 10 Å/s

 

ROUTINE PROCESS

Silicon Deposition

  • Thickness: from 10 nm to 2000 nm

Metal Deposition

  • Type: Au, Cr, Ni
  • Thickness: from 10 nm to 2000 nm

 

ROUTINE PROCESS

Oxide Deposition

  • Type: ITO, silicon dioxide
  • Thickness: from 10 nm to 20000 nm

Nitride Deposition

  • Type of nitride: silicon nitride
  • Thickness: from 10 nm to 2000 nm

To use this equipment

The equipment available is accessible to the academic and industrial research community.

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