Scanning Electron Microscopy with field emission

Description

Manufacturer Zeiss
MODEL GEminiSEM 560

Description:

Surface characterization and elemental chemical analysis

Characteristics:

  • Resolution: 0,5 nm @ 15 kV / 0,8 nm @ 1 kV / 1,0 nm @ 500 V
  • Magnification: 1X to 2000000X
  • Electron gun: Schottky thermal field emission
  • Probe current: 3 pA to 20 nA
  • Acceleration Voltage: 0,02 to 30 kV
  • Variable pressure mode (10 to 60 Pa)
  • Secondary electron Everhart-Thornley detector
  • In Lens secondary electron detector
  • BxE Backscattered electron detector
  • aBSD4 Backscattered electron detector)
  • VPSE detector (variable pressure mode)
  • Specimen stage X: 153 mm / Y: 153 mm / Z: 50 mm / Z’: 13 mm / Tilt: -15 to 70 degrees / Rotation: 360 degrees continuous
  • X-Rays Energy dispersive spectrometer (EDS): Oxford Ultim Max allowing elemental chemical analysis.