X-Ray Diffractometer (xrd) (X-Pert PRO MRD)

$0.00

Description

Additional information

MANUFACTURER Panalytical
MODEL X-Pert PRO MRD

Samples

  • Types : powder, thin film, ceramics…
  • Sample size: 100 mm (4 in.) maximum
  • Thickness: 5 mm

Applications

  • Semi-quantitative or quantitative analysis
  • Measurement of epitaxial layers quality (Bragg-Brentano, grazing incidence, phi-scan, rocking curve, polar figure, Reciprocal space mapping, in-plane diffraction)
  • Reflectivity to determine the density and thickness of single or multiple thin films

Characteristics

  • X-ray source : CuKα, l = 1.542 Å
  • Parralel and divergent beams
  • Horizontal measurement configuration
  • Detector : proportional, gas based
  • 4 circle platform:
    • 2θ = -10° à 150°
    • Ω = -90° à +90°
    • Φ = 0° à 360°
    • Ψ = -90° à +90°
    • X and Y : 100 mm displacement
    • Z : 11 mm displacement
  • Rocking Curve and Parallel Plate modules, Collimator 0.18° (PPC)

Additional information

MANUFACTURER

Panalytical

MODEL

X-Pert PRO MRD