X-Ray Diffractometer (xrd) (X-Pert PRO MRD)
X-Ray Diffractometer (xrd) (X-Pert PRO MRD)
Additional information
| MANUFACTURER | Panalytical |
|---|---|
| MODEL | X-Pert PRO MRD |
Samples
- Types : powder, thin film, ceramics…
- Sample size: 100 mm (4 in.) maximum
- Thickness: 5 mm
Applications
- Semi-quantitative or quantitative analysis
- Measurement of epitaxial layers quality (Bragg-Brentano, grazing incidence, phi-scan, rocking curve, polar figure, Reciprocal space mapping, in-plane diffraction)
- Reflectivity to determine the density and thickness of single or multiple thin films
Characteristics
- X-ray source : CuKα, l = 1.542 Å
- Parralel and divergent beams
- Horizontal measurement configuration
- Detector : proportional, gas based
- 4 circle platform:
- 2θ = -10° à 150°
- Ω = -90° à +90°
- Φ = 0° à 360°
- Ψ = -90° à +90°
- X and Y : 100 mm displacement
- Z : 11 mm displacement
- Rocking Curve and Parallel Plate modules, Collimator 0.18° (PPC)
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about usage conditions and availability, please fill out the form below. After reviewing your request, we will contact you shortly to offer you the best available solution.