X-ray Photoelectron Spectroscopy (xps) (Axis-Ultra)

$0.00

Description

Additional information

MANUFACTURER Kratos Analytical
MODEL Axis-Ultra

Analysis

  • Multifunction apparatus equipped with an ultra-high vacuum system
  • Bi-dimensional characterization of heterogeneous surfaces via energy-resolved parallel XPS imaging
  • Surface analysis coupling 3 characterization techniques: X-ray Photoelectron Spectroscopy (XPS); Ion Scattering Spectroscopy (ISS); Auger Scanning Microscopy (ASM)

Characteristics

  • Double Source Mg-Al
  • Monochromatic Al Source Al
  • Large radius hemispherical analyzer
  • 8 channel detection
  • Resolution is 0.48 eV on Silver
  • Integrated high temperature and high pressure reactor

 

MODES

ISS

  • Model : ISS Kratos-Ultra
  • Resolution : 1.2% with He 1000 eV (Au)

ASM

  • Model : AES Kratos-Ultra
  • Canon 10 keV LAB6
  • Spatial resolution : 0.1 µm
  • S/N : from 500 to 500 kcps on Cu-KLL

Additional information

MANUFACTURER

Kratos Analytical

MODEL

Axis-Ultra