X-ray Photoelectron Spectroscopy (xps) (Axis-Ultra)
X-ray Photoelectron Spectroscopy (xps) (Axis-Ultra)
Additional information
| MANUFACTURER | Kratos Analytical |
|---|---|
| MODEL | Axis-Ultra |
Analysis
- Multifunction apparatus equipped with an ultra-high vacuum system
- Bi-dimensional characterization of heterogeneous surfaces via energy-resolved parallel XPS imaging
- Surface analysis coupling 3 characterization techniques: X-ray Photoelectron Spectroscopy (XPS); Ion Scattering Spectroscopy (ISS); Auger Scanning Microscopy (ASM)
Characteristics
- Double Source Mg-Al
- Monochromatic Al Source Al
- Large radius hemispherical analyzer
- 8 channel detection
- Resolution is 0.48 eV on Silver
- Integrated high temperature and high pressure reactor
MODES
ISS
- Model : ISS Kratos-Ultra
- Resolution : 1.2% with He 1000 eV (Au)
ASM
- Model : AES Kratos-Ultra
- Canon 10 keV LAB6
- Spatial resolution : 0.1 µm
- S/N : from 500 to 500 kcps on Cu-KLL
Related products
To use this equipment
The equipment available is accessible to the academic and industrial research community.
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