X-ray Photoelectron Spectroscopy (xps)(PHI 5600-ci spectrometer)
X-ray Photoelectron Spectroscopy (xps)(PHI 5600-ci spectrometer)
Additional information
| MANUFACTURER | Physical Electronics |
|---|---|
| MODEL | PHI 5600-ci spectrometer |
Analysis
- Analysis of surface composition
- Depth sampled: 2 to 10 nm
- Elements observed : from Lithium
Characteristics
- Surface descum possible
- Variable angle analysis
- Analyzed area: from 300 µm2 to 0.8 mm2
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To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about usage conditions and availability, please fill out the form below. After reviewing your request, we will contact you shortly to offer you the best available solution.