Atomic Force Microscopy (afm) (Dimensions 3100)
Atomic Force Microscopy (afm) (Dimensions 3100)
Additional information
| MANUFACTURER | Digital Instruments |
|---|---|
| MODEL | Dimensions 3100 |
Samples
- Sample size: maximum 101 mm (4”)
- Thickness: maximum 12.7 mm (0.5”)
- Open geometry
Analysis
- Modes: Contact mode, Tapping mode, Lateral Force Microscopy (LFM), Magnetic Force Microscopy (MFM), Scanning Tunnel Microscopy (STM)
- Topographical measurements: quantitative
- Measurement of viscoelastic properties: qualitative
- Mapping possible
- Lateral resolution: 2 nm
Applications
- Measurements of topography in ambient or liquid environments
- Measurements of mechanical properties
- Measurement of friction
- Measurement of roughness
- Measurement of magnetic field gradients
- Measurement of electrical fields gradients
- Measurement of tip/surface interaction force
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To use this equipment
The equipment available is accessible to the academic and industrial research community.
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