Scanning Electron Microscope (sem) (JSM 6300F)
Scanning Electron Microscope (sem) (JSM 6300F)
Additional information
| MANUFACTURER | JEOL |
|---|---|
| MODEL | JSM 6300F |
Samples
- Samples size: 100 mm (4 in.) maximum
Analysis
- High resolution surface imaging
- Lateral resolution : ~ 3 nm
Variants
- Detection of back-scattered electrons for phase analysis
- Detection and quantification of the elements via Energy Dispersive Spectrometry (EDS) for the determination of the chemical composition
Characteristics
- Probe current : 10-12 A to 10-10 A
- Working Distance (WD): 3 mm to 53 mm
- Magnification : 10X (WD = 39 mm) to 500,000X
ELECTRON GUN
- Field effect (cold cathode)
- Accelerating voltage: 0.5 to 30 kV
- Tip made from Tungsten <310>
Detectors
- Scintillator for secondary electrons
- Si PN junction for back-scattered electrons
- X-ray detector for EDS analysis (all elements starting from Carbon)
To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about usage conditions and availability, please fill out the form below. After reviewing your request, we will contact you shortly to offer you the best available solution.