Atomic Force Microscopy (afm) (Dimensions 3100)

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Description

Additional information

MANUFACTURER Digital Instruments
MODEL Dimensions 3100

Samples

  • Sample size: maximum 101 mm (4”)
  • Thickness: maximum 12.7 mm (0.5”)
  • Open geometry

Analysis

  • Modes: Contact mode, Tapping mode, Lateral Force Microscopy (LFM), Magnetic Force Microscopy (MFM), Scanning Tunnel Microscopy (STM)
  • Topographical measurements: quantitative
  • Measurement of viscoelastic properties: qualitative
  • Mapping possible
  • Lateral resolution: 2 nm

Applications

  • Measurements of topography in ambient or liquid environments
  • Measurements of mechanical properties
  • Measurement of friction
  • Measurement of roughness
  • Measurement of magnetic field gradients
  • Measurement of electrical fields gradients
  • Measurement of tip/surface interaction force

Additional information

MANUFACTURER

Digital Instruments

MODEL

Dimensions 3100