Auger Spectroscopy (JAMP-30 Auger Microprobe)
Auger Spectroscopy (JAMP-30 Auger Microprobe)
Additional information
| MANUFACTURER | JEOL |
|---|---|
| MODEL | JAMP-30 Auger Microprobe |
Equipment unique in Quebec, allowing:
- The in-situ breaking of liquid nitrogen cooled samples for the contamination-free analysis of the broken surface
- Semi-quantitative surface and depth profile analysis of the chemical composition
- Depth profiling up to 1 µm
- Depth and surface mapping available
- Lateral resolution: ~ 1 µm
- Equipped with an Argon ion beam for sputtering (depth profiling)
Applications
- Composition profiling of thin films
- Study of surface contamination
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To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about usage conditions and availability, please fill out the form below. After reviewing your request, we will contact you shortly to offer you the best available solution.