Auger Spectroscopy (JAMP-30 Auger Microprobe)

$0.00

Description

Additional information

MANUFACTURER JEOL
MODEL JAMP-30 Auger Microprobe

Equipment unique in Quebec, allowing:

  • The in-situ breaking of liquid nitrogen cooled samples for the contamination-free analysis of the broken surface
  • Semi-quantitative surface and depth profile analysis of the chemical composition
  • Depth profiling up to 1 µm
  • Depth and surface mapping available
  • Lateral resolution: ~ 1 µm
  • Equipped with an Argon ion beam for sputtering (depth profiling)

Applications

  • Composition profiling of thin films
  • Study of surface contamination

Additional information

MANUFACTURER

JEOL

MODEL

JAMP-30 Auger Microprobe