Benchtop Scanning Electron Microscope with EDX
Benchtop Scanning Electron Microscope with EDX
| MANUFACTURER | Jeol |
|---|---|
| MODEL | Neoscope III |
General description:
This instrument is designed for observing the microstructure of samples using a 5- or 15-kV accelerated electron beam as a light source. The microscope is equipped with two detectors to detect backscattered and secondary electrons (BSE and SE) and provide an image with good depth of field. The samples observed can be solids (films, powders, pieces, etc.), but the instrument is not capable of observing liquid samples. This instrument is also equipped with an EDX (elemental analysis) detection system to identify the various atoms present on the surface of the observed sample. It is also possible to perform atomic mapping of the surface using this additional detector and to determine the concentration of each atom on the analyzed surface.
Applications:
Electronic observation of solid samples, microstructure, EDX analysis.
Characteristics:
- Maximum sample dimensions: 80 mm x 50 mm (D x H)
- Voltages: 5, 10, and 15 kV
- Detectors: BSE, SE, and EDX
- Magnification: from 10x to 100,000x
- Image resolution: 4,063 x 3,072 pixels[
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To use this equipment
The equipment available is accessible to the academic and industrial research community.
To learn about usage conditions and availability, please fill out the form below. After reviewing your request, we will contact you shortly to offer you the best available solution.